Unifying methodologies for high fault coverage concurrent and off-line test of digital filters
نویسندگان
چکیده
A low-cost on-line test scheme for digital filters that additionally provides an off-line BIST solution is proposed. The scheme utilizes an invariant of the digital filter in order to detect on-line possible circuit malfunctions. The on-line checking hardware is shared with off-line BIST. The analysis performed indicates that exact 100% fault secureness is attained when the digital filter is designed according to design criteria that we identify in the paper. Furthermore, fault simulations show near 100% fault coverage for off-line BIST.
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Combined On-Line/Off-Line Test Solutions for Digital Filters
A low-cost on-line test scheme for digital filters, capable of providing an off-line BIST solution, is proposed. The scheme utilizes an invariant of the digital filter in order to detect possible circuit malfunctioning on-line and shares most of this on-line checking hardware with off-line BIST. The analysis performed indicates that 100% fault secureness & 100% fault coverage are possible, if c...
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